IC product lifetime as function of junction temperature











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If an IC is rated for an absolute maximum junction temperature of say 170 Celsius, obviously it is not recommended to operate there - but how drastically is product lifetime impacted if we are close, say operating at junction temperature of 160. How severely does the IC lifetime get shortened as we get closer to the maximum junction temperature ?










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    If an IC is rated for an absolute maximum junction temperature of say 170 Celsius, obviously it is not recommended to operate there - but how drastically is product lifetime impacted if we are close, say operating at junction temperature of 160. How severely does the IC lifetime get shortened as we get closer to the maximum junction temperature ?










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      up vote
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      favorite









      up vote
      3
      down vote

      favorite











      If an IC is rated for an absolute maximum junction temperature of say 170 Celsius, obviously it is not recommended to operate there - but how drastically is product lifetime impacted if we are close, say operating at junction temperature of 160. How severely does the IC lifetime get shortened as we get closer to the maximum junction temperature ?










      share|improve this question













      If an IC is rated for an absolute maximum junction temperature of say 170 Celsius, obviously it is not recommended to operate there - but how drastically is product lifetime impacted if we are close, say operating at junction temperature of 160. How severely does the IC lifetime get shortened as we get closer to the maximum junction temperature ?







      integrated-circuit thermal






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      asked 3 hours ago









      VanGo

      419415




      419415






















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          There are two rules of thumb when it comes to premature aging of electronics and temperature:




          1. Every 10°C above 25°C halves its life


          2. Every 15°C above 25°C halves its life.



          The 10°C is derived from a certain application of Arrhenius' equation



          $ AF = e^{ frac{E_a}{k}}(frac{1}{T_{use}}- frac{1}{T_{test}}) $



          The issue with this is the 10°C result was a very broad interpretation of the empirical results (no consideration was given to other failure modes).



          MIL-HDBK-217 took into account field data and concluded that 15°C is a figure more applicable to practical usage



          https://www.electronics-cooling.com/2017/08/10c-increase-temperature-really-reduce-life-electronics-half/






          share|improve this answer























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            1 Answer
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            1 Answer
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            active

            oldest

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            active

            oldest

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            active

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            up vote
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            down vote



            accepted










            There are two rules of thumb when it comes to premature aging of electronics and temperature:




            1. Every 10°C above 25°C halves its life


            2. Every 15°C above 25°C halves its life.



            The 10°C is derived from a certain application of Arrhenius' equation



            $ AF = e^{ frac{E_a}{k}}(frac{1}{T_{use}}- frac{1}{T_{test}}) $



            The issue with this is the 10°C result was a very broad interpretation of the empirical results (no consideration was given to other failure modes).



            MIL-HDBK-217 took into account field data and concluded that 15°C is a figure more applicable to practical usage



            https://www.electronics-cooling.com/2017/08/10c-increase-temperature-really-reduce-life-electronics-half/






            share|improve this answer



























              up vote
              4
              down vote



              accepted










              There are two rules of thumb when it comes to premature aging of electronics and temperature:




              1. Every 10°C above 25°C halves its life


              2. Every 15°C above 25°C halves its life.



              The 10°C is derived from a certain application of Arrhenius' equation



              $ AF = e^{ frac{E_a}{k}}(frac{1}{T_{use}}- frac{1}{T_{test}}) $



              The issue with this is the 10°C result was a very broad interpretation of the empirical results (no consideration was given to other failure modes).



              MIL-HDBK-217 took into account field data and concluded that 15°C is a figure more applicable to practical usage



              https://www.electronics-cooling.com/2017/08/10c-increase-temperature-really-reduce-life-electronics-half/






              share|improve this answer

























                up vote
                4
                down vote



                accepted







                up vote
                4
                down vote



                accepted






                There are two rules of thumb when it comes to premature aging of electronics and temperature:




                1. Every 10°C above 25°C halves its life


                2. Every 15°C above 25°C halves its life.



                The 10°C is derived from a certain application of Arrhenius' equation



                $ AF = e^{ frac{E_a}{k}}(frac{1}{T_{use}}- frac{1}{T_{test}}) $



                The issue with this is the 10°C result was a very broad interpretation of the empirical results (no consideration was given to other failure modes).



                MIL-HDBK-217 took into account field data and concluded that 15°C is a figure more applicable to practical usage



                https://www.electronics-cooling.com/2017/08/10c-increase-temperature-really-reduce-life-electronics-half/






                share|improve this answer














                There are two rules of thumb when it comes to premature aging of electronics and temperature:




                1. Every 10°C above 25°C halves its life


                2. Every 15°C above 25°C halves its life.



                The 10°C is derived from a certain application of Arrhenius' equation



                $ AF = e^{ frac{E_a}{k}}(frac{1}{T_{use}}- frac{1}{T_{test}}) $



                The issue with this is the 10°C result was a very broad interpretation of the empirical results (no consideration was given to other failure modes).



                MIL-HDBK-217 took into account field data and concluded that 15°C is a figure more applicable to practical usage



                https://www.electronics-cooling.com/2017/08/10c-increase-temperature-really-reduce-life-electronics-half/







                share|improve this answer














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                edited 3 hours ago

























                answered 3 hours ago









                JonRB

                12.9k21940




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